Faculty Publications
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Item Characterization of p-CdTe/n-CdS hetero-junctions(2009) Mahesha, M.G.; Bangera, K.V.; Shivakumar, G.K.Nano-crystalline CdTe/CdS thin film hetero-junctions have been grown on glass substrate by thermal evaporation technique. The growth conditions to get stoichiometric compound films have been optimized. The grown hetero-junctions have been characterized for their I-V characteristics. Analysis of I-V characteristics has been made to investigate the current conduction mechanism in p-CdTe/n-CdS hetero-junction. The band gap energy of cadmium telluride and cadmium sulfide films have been computed from the study of variation of resistance with temperature. Based on the study, band diagram for p-CdTe/n-CdS hetero-junction has been proposed.Item Studies on vacuum deposited p-ZnTe/n-CdTe heterojunction diodes(2011) Rao, K.G.; Bangera, K.V.; Shivakumar, G.K.The present paper reports the fabrication and detailed electrical characterization of p-ZnTe/n-CdTe heterojunction diodes prepared by vacuum deposition method. The possible conduction mechanisms of the heterojunction diode were determined by analyzing the I-V characteristics. The C-V characteristics of the heterojunction diodes were studied to determine the barrier height, carrier concentration and thickness of the depletion region in the heterojunction. A theoretical band diagram of the heterojunction was drawn based on Anderson's model. © 2010 Elsevier Ltd. All rights reserved.Item Band gap engineering of mixed Cd(1?x)Zn(x)Se thin films(Elsevier Ltd, 2017) Santhosh, T.C.M.; Bangera, K.V.; Shivakumar, G.K.This paper deals with band gap engineering in CdZnSe thin films. This was achieved by adding different amounts of zinc selenide (ZnSe) to cadmium selenide (CdSe). The weight percentage of ZnSe (x) was varied from 0 to 1 in steps of 0.2. The films were prepared using thermal evaporation technique. The structural analysis was carried out using X-ray diffraction. Surface morphology and elemental composition of the grown films was investigated using scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS) respectively. As deposited cadmium selenide thin films were dark reddish in color, changes to lemon-yellow with increase in ZnSe concentration. Electrical transport studies have been carried out using two probe method. Resistivity of the mixed films increased with increase in ZnSe concentration and it shows semiconducting behavior. It is observed that activation energy for conduction increases from 0.39 eV to 0.85 eV with increase in ZnSe concentration. Optical properties of the films were analyzed from absorption and transmittance studies. It is observed that the optical band gap increases gradually from 1.67 eV to 2.60 eV as ‘x’ varied from 0 to 1. © 2017 Elsevier B.V.Item Effect of Bi doping on the properties of CdSe thin films for optoelectronic device applications(Elsevier Ltd, 2017) Santhosh, T.C.M.; Bangera, K.V.; G.k, S.CdSe and Bi (1%, 2%, 3%) doped CdSe thin films were deposited on the glass substrates using thermal evaporation technique. Effect of Bi doping on the structural, optical, electrical and photo response properties of CdSe thin films were investigated. The X-ray diffraction studies reveals that undoped and Bi doped CdSe films are polycrystalline in nature with hexagonal crystal structure along (002) direction. No significant changes are observed in the lattice parameters or the grain size indicating minimum lattice distortion. The optical band gap of undoped CdSe film was estimated to be 1.67 eV. Replacement of cadmium by bismuth results in an increase in the electrical conductivity of doped films. Doping with bismuth is found to improve the photo sensitivity of CdSe thin films. © 2017 Elsevier LtdItem Effect of cadmium incorporation on the properties of zinc oxide thin films(Springer Nature, 2018) Bharath, S.P.; Bangera, K.V.; Shivakumar, G.K.CdxZn1-xO (0 ? x ? 0.20) thin films are deposited on soda lime glass substrates using spray pyrolysis technique. To check the thermal stability, CdxZn1-xO thin films are subjected to annealing. Both the as-deposited and annealed CdxZn1-xO thin films are characterized using X-ray diffraction (XRD), scanning electron microscope (SEM) and energy-dispersive X-ray analysis (EDAX) to check the structural, surface morphological and compositional properties, respectively. XRD analysis reveals that the both as-deposited and annealed CdxZn1-xO thin films are (002) oriented with wurtzite structure. SEM studies confirm that as-deposited, as well as annealed CdxZn1-xO thin films are free from pinholes and cracks. Compositional analysis shows the deficiency in Cd content after annealing. Optical properties evaluated from UV-Vis spectroscopy shows red shift in the band gap for CdxZn1-xO thin films. Electrical property measured using two probe method shows a decrease in the resistance after Cd incorporation. The results indicate that cadmium can be successfully incorporated in zinc oxide thin films to achieve structural changes in the properties of films. © Springer-Verlag GmbH Germany, part of Springer Nature 2018.