Study of the effect of annealing parameters on the perovskite material (CH3NH3SnCl3) using PL spectra

Abstract

Methylammonium Tin Chloride (MASnCl3) perovskite thin films were prepared using solution processing viz spin coating and dip coating techniques. The prepared films were characterized by powder XRD for structural confirmation and their optical band gaps were estimated using Tauc's plot. Photoluminescence (PL) studies were performed on vacuum and ambient annealed perovskite films. The thin films annealed in vacuum condition exhibited higher PL intensity, indicative of lesser defect sites. Further, PL intensities of vacuum annealed samples at two different temperatures, 150�C and 200�C were compared. The results confirmed that the samples vacuum annealed at 150�C show lesser defect sites, and implies a good annealing parameter for use in practical device applications. � 2019 Author(s).