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Title: | Test Methodology for Analysis of Coexistent Logic-Level Faults in NoC Channels |
Authors: | Bhowmik B. Biswas S. Deka J.K. |
Issue Date: | 2020 |
Citation: | IEEE Transactions on Systems, Man, and Cybernetics: Systems , Vol. 2020-October , , p. 2339 - 2344 |
Abstract: | With the continuous growth in wire density, the reliability has become a dominant burden while channels of a modern NoC are exposed to various faults. A key requirement for the NoC is therefore to propose a mechanism that can account for a channel fault since it significantly impacts NoC performance. This paper presents a distributed test strategy that detects and diagnoses logic-level faults coexist in NoC channels and deeply analyze the severe impact of these faults on network performance. Fault coexistence in channels makes a fraction undetectable and is addressed here. Simulation results demonstrate the effectiveness of the proposed strategy. © 2020 IEEE. |
URI: | https://doi.org/10.1109/SMC42975.2020.9283106 http://idr.nitk.ac.in/jspui/handle/123456789/15083 |
Appears in Collections: | 2. Conference Papers |
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