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DC Field | Value | Language |
---|---|---|
dc.contributor.author | Bhowmik B. | |
dc.contributor.author | Biswas S. | |
dc.contributor.author | Deka J.K. | |
dc.date.accessioned | 2021-05-05T10:16:23Z | - |
dc.date.available | 2021-05-05T10:16:23Z | - |
dc.date.issued | 2020 | |
dc.identifier.citation | IEEE Transactions on Systems, Man, and Cybernetics: Systems , Vol. 2020-October , , p. 2339 - 2344 | en_US |
dc.identifier.uri | https://doi.org/10.1109/SMC42975.2020.9283106 | |
dc.identifier.uri | http://idr.nitk.ac.in/jspui/handle/123456789/15083 | - |
dc.description.abstract | With the continuous growth in wire density, the reliability has become a dominant burden while channels of a modern NoC are exposed to various faults. A key requirement for the NoC is therefore to propose a mechanism that can account for a channel fault since it significantly impacts NoC performance. This paper presents a distributed test strategy that detects and diagnoses logic-level faults coexist in NoC channels and deeply analyze the severe impact of these faults on network performance. Fault coexistence in channels makes a fraction undetectable and is addressed here. Simulation results demonstrate the effectiveness of the proposed strategy. © 2020 IEEE. | en_US |
dc.title | Test Methodology for Analysis of Coexistent Logic-Level Faults in NoC Channels | en_US |
dc.type | Conference Paper | en_US |
Appears in Collections: | 2. Conference Papers |
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