Please use this identifier to cite or link to this item: https://idr.nitk.ac.in/jspui/handle/123456789/15023
Title: Reliability Monitoring in a Smart NoC Component
Authors: Bhowmik B.
Deka J.K.
Biswas S.
Issue Date: 2020
Citation: ICECS 2020 - 27th IEEE International Conference on Electronics, Circuits and Systems, Proceedings , Vol. , , p. -
Abstract: SMART NoC topology components, such as octagon, spidergon are progressively becoming the primary design choice for implementing the communication backbone in a multi-core SoC platform for lowering a high number of inter-router hops required by long-range traffic. However, aggressive technology scaling has increased the number of transient/permanent faults raising the reliability concerns in a SMART NoC. This paper presents a reliability monitoring scheme for addressing channel-short faults in the basic octagon NoC. Along with the online detection and diagnosis of short faults, an effective scheduling scheme is proposed to provide a low-cost test solution that outperforms over a set of prior schemes. © 2020 IEEE.
URI: https://doi.org/10.1109/ICECS49266.2020.9294931
http://idr.nitk.ac.in/jspui/handle/123456789/15023
Appears in Collections:2. Conference Papers

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