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Title: Review on microstructure evolution in Sn-Ag-Cu solders and its effect on mechanical integrity of solder joints
Authors: Sona M.
Prabhu K.N.
Issue Date: 2013
Citation: Journal of Materials Science: Materials in Electronics, 2013, Vol.24, 9, pp.3149-3169
Abstract: The use of Pb-bearing solders in electronic assemblies is avoided in many countries due to the inherent toxicity and environmental risks associated with lead. Although a number of "Pb-free" alloys have been invented, none of them meet all the standards generally satisfied by a conventional Pb-Sn alloy. A large number of reliability problems still exist with lead free solder joints. Solder joint reliability depends on mechanical strength, fatigue resistance, hardness, coefficient of thermal expansion which are influenced by the microstructure, type and morphology of inter metallic compounds (IMC). In recent years, Sn rich solders have been considered as suitable replacement for Pb bearing solders. The objective of this review is to study the evolution of microstructural phases in commonly used lead free xSn-yAg-zCu solders and the various factors such as substrate, minor alloying, mechanical and thermo-mechanical strains which affect the microstructure. A complete understanding of the mechanisms that determine the formation and growth of interfacial IMCs is essential for developing solder joints with high reliability. The data available in the open literature have been reviewed and discussed. © 2013 Springer Science+Business Media New York.
URI: 10.1007/s10854-013-1240-0
Appears in Collections:5. Miscellaneous Publications

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