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|Title:||Reactive wetting, evolution of interfacial and bulk IMCs and their effect on mechanical properties of eutectic Sn-Cu solder alloy|
|Citation:||Advances in Colloid and Interface Science, 2011, Vol.166, 43862, pp.87-118|
|Abstract:||Lead free solders are increasingly being used in electronic applications. Eutectic Sn-Cu solder alloy is one of the most favored lead free alloys used for soldering in electronic applications. It is inexpensive and principally used in wave soldering. Wetting of liquid solder on a substrate is a case of reactive wetting and is accompanied by the formation of intermetallic compounds (IMCs) at the interface. Wettability of Sn-0.7Cu solder on metallic substrates is significantly affected by the temperature and the type of flux. The wettability and microstructural evolution of IMCs at the Sn-0.7Cu solder/substrate interfaces are reviewed in the present paper. The reliability of solder joints in electronic packaging is controlled by the type and morphology of interfacial IMCs formed between Sn-0.7Cu solder and substrates. The formation and growth mechanisms of interfacial IMCs are highlighted. Mechanical behavior of bulk solder alloy and solder joint interfaces are analyzed. The characteristics of the IMCs which have marked effect on the mechanical properties and fracture behavior as well as reliability of solder joints of the alloy are discussed. An attempt has also been made to discuss the effect of cooling rate and strain rate on shear strength, tensile properties and creep resistance of the solder alloy. It is recommended that future work should focus on evolving a standard procedure involving sequential assessment of wetting behavior, evolution of IMCs and mechanical properties. © 2011 Elsevier B.V.|
|Appears in Collections:||5. Miscellaneous Publications|
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