The effect of substrate temperature on the structural, optical and electrical properties of vacuum deposited ZnTe thin films

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dc.contributor.authorRao, G.K.
dc.contributor.authorBangera, K.V.
dc.contributor.authorShivakumar, G.K.
dc.date.accessioned2026-02-05T09:36:40Z
dc.date.issued2009
dc.description.abstractThe present paper reports the effect of substrate temperature on the structural, optical and electrical properties of vacuum deposited zinc telluride (ZnTe) thin films. X-ray diffraction (XRD) analysis of the films, deposited on glass substrates, revealed that they have cubic structure with strong (111) texture. Room temperature deposits are tellurium rich and an increase in the substrate temperature up to 553 °K results in stoichiometric films. Electrical conductivity has been observed to increase with the increase in substrate temperature, accompanied by increase in the carrier concentration and the mobility of the carriers. The optical bandgap energy and the thermal activation energy of the films have also been evaluated. © 2009 Elsevier Ltd. All rights reserved.
dc.identifier.citationVacuum, 2009, 83, 12, pp. 1485-1488
dc.identifier.issn0042207X
dc.identifier.urihttps://doi.org/10.1016/j.vacuum.2009.06.047
dc.identifier.urihttps://idr.nitk.ac.in/handle/123456789/27609
dc.subjectCubic structure
dc.subjectElectrical conductivity
dc.subjectGlass substrates
dc.subjectOptical and electrical properties
dc.subjectOptical band gap energy
dc.subjectRoom temperature
dc.subjectStoichiometric films
dc.subjectSubstrate temperature
dc.subjectThermal activation energies
dc.subjectXRD
dc.subjectZinc telluride
dc.subjectZinc tellurides
dc.subjectZnTe thin films
dc.subjectActivation energy
dc.subjectCarrier concentration
dc.subjectCarrier mobility
dc.subjectDeposition
dc.subjectElectric conductivity
dc.subjectGyrators
dc.subjectHall effect
dc.subjectMagnetic field effects
dc.subjectOptical properties
dc.subjectSemiconducting zinc compounds
dc.subjectTellurium
dc.subjectTellurium compounds
dc.subjectThermal effects
dc.subjectThin film devices
dc.subjectThin films
dc.subjectVacuum
dc.subjectVacuum deposition
dc.subjectX ray diffraction
dc.subjectX ray diffraction analysis
dc.subjectZinc
dc.subjectSubstrates
dc.titleThe effect of substrate temperature on the structural, optical and electrical properties of vacuum deposited ZnTe thin films

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