The effect of substrate temperature on the structural, optical and electrical properties of vacuum deposited ZnTe thin films
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Date
2009
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Abstract
The present paper reports the effect of substrate temperature on the structural, optical and electrical properties of vacuum deposited zinc telluride (ZnTe) thin films. X-ray diffraction (XRD) analysis of the films, deposited on glass substrates, revealed that they have cubic structure with strong (111) texture. Room temperature deposits are tellurium rich and an increase in the substrate temperature up to 553 °K results in stoichiometric films. Electrical conductivity has been observed to increase with the increase in substrate temperature, accompanied by increase in the carrier concentration and the mobility of the carriers. The optical bandgap energy and the thermal activation energy of the films have also been evaluated. © 2009 Elsevier Ltd. All rights reserved.
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Keywords
Cubic structure, Electrical conductivity, Glass substrates, Optical and electrical properties, Optical band gap energy, Room temperature, Stoichiometric films, Substrate temperature, Thermal activation energies, XRD, Zinc telluride, Zinc tellurides, ZnTe thin films, Activation energy, Carrier concentration, Carrier mobility, Deposition, Electric conductivity, Gyrators, Hall effect, Magnetic field effects, Optical properties, Semiconducting zinc compounds, Tellurium, Tellurium compounds, Thermal effects, Thin film devices, Thin films, Vacuum, Vacuum deposition, X ray diffraction, X ray diffraction analysis, Zinc, Substrates
Citation
Vacuum, 2009, 83, 12, pp. 1485-1488