Characterization of p-CdTe/n-CdS hetero-junctions
| dc.contributor.author | Mahesha, M.G. | |
| dc.contributor.author | Bangera, K.V. | |
| dc.contributor.author | Shivakumar, G.K. | |
| dc.date.accessioned | 2026-02-05T09:36:41Z | |
| dc.date.issued | 2009 | |
| dc.description.abstract | Nano-crystalline CdTe/CdS thin film hetero-junctions have been grown on glass substrate by thermal evaporation technique. The growth conditions to get stoichiometric compound films have been optimized. The grown hetero-junctions have been characterized for their I-V characteristics. Analysis of I-V characteristics has been made to investigate the current conduction mechanism in p-CdTe/n-CdS hetero-junction. The band gap energy of cadmium telluride and cadmium sulfide films have been computed from the study of variation of resistance with temperature. Based on the study, band diagram for p-CdTe/n-CdS hetero-junction has been proposed. | |
| dc.identifier.citation | Materials Science in Semiconductor Processing, 2009, 12, 3, pp. 89-93 | |
| dc.identifier.issn | 13698001 | |
| dc.identifier.uri | https://doi.org/10.1016/j.mssp.2009.07.014 | |
| dc.identifier.uri | https://idr.nitk.ac.in/handle/123456789/27632 | |
| dc.subject | Band diagrams | |
| dc.subject | Band gap energy | |
| dc.subject | CdS | |
| dc.subject | CdTe | |
| dc.subject | CdTe/CdS thin films | |
| dc.subject | Current conduction mechanisms | |
| dc.subject | Glass substrates | |
| dc.subject | Growth conditions | |
| dc.subject | IV characteristics | |
| dc.subject | Nanocrystallines | |
| dc.subject | Stoichiometric compound | |
| dc.subject | Thermal evaporation technique | |
| dc.subject | Cadmium | |
| dc.subject | Cadmium alloys | |
| dc.subject | Cadmium sulfide | |
| dc.subject | Cadmium telluride | |
| dc.subject | Data storage equipment | |
| dc.subject | Thermal evaporation | |
| dc.subject | Cadmium compounds | |
| dc.title | Characterization of p-CdTe/n-CdS hetero-junctions |
