Ru–TiO2 semiconducting nanoparticles for the photo-catalytic degradation of bromothymol blue

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Date

2016

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Springer New York LLC barbara.b.bertram@gsk.com

Abstract

Photo-catalytic degradation of bromothymol blue (BTB) in an aqueous medium by Ru–TiO<inf>2</inf> using UVC (254 nm) irradiation was investigated for a pH range of 4.0–8.0. The liquid impregnation method was used to synthesize 0.2, 0.4 and 0.8 % ruthenium doped TiO<inf>2</inf> (Ru–TiO<inf>2</inf>) nanoparticles. The characterizations of resulting nanoparticles were done using X-ray diffraction, scanning electron microscopy, fourier transform infrared spectroscopy, transmission electron microscopy (TEM) and energy dispersive X-ray spectroscopy analysis. The crystallite sizes of doped and undoped nanoparticles were determined from X-ray diffraction spectra using Scherrer equation. The average crystallite size of undoped TiO<inf>2</inf> was found to be 17.00 nm, whereas the crystallite sizes of 0.2, 0.4 and 0.8 % Ru–TiO<inf>2</inf> were 16.67, 15.70 and 14.40 nm respectively. The TEM images confirm the particle sizes to be 10–40 nm. Pseudo-first order rate constants (k<inf>obs</inf>) determined were found to decrease with increase in pH. The effect of BTB Concentration, catalyst dosage, a percentage of doping of photo catalyst, pH and UV light intensity of BTB on the degradation rate were also examined. © 2016, Springer Science+Business Media New York.

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Keywords

Catalysts, Degradation, Electron microscopy, Energy dispersive spectroscopy, Fourier transform infrared spectroscopy, High resolution transmission electron microscopy, Nanoparticles, Rate constants, Scanning electron microscopy, Synthesis (chemical), Titanium dioxide, Transmission electron microscopy, X ray diffraction, X ray spectroscopy, Energy dispersive x-ray spectroscopy analysis, Liquid impregnation, Photo catalytic degradation, Pseudo first order rate constants, Scherrer equations, Semi-conducting nanoparticles, UV light intensity, X-ray diffraction spectrum, Crystallite size

Citation

Journal of Materials Science: Materials in Electronics, 2016, 27, 12, pp. 13065-13074

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