Faculty Publications
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Item Electrical switching behavior of bulk Si15Te85-xSbx chalcogenide glasses - A study of compositional dependence(2010) Lokesh, R.; Udayashankar, N.K.; Asokan, S.Studies on the electrical switching behavior of melt quenched bulk Si15Te85-xSbx glasses have been undertaken in the composition range (1 ? x ? 10), in order to understand the effect of Sb addition on the electrical switching behavior of Si15Te85-x base glass. It has been observed that all the Si15Te85-xSbx glasses studied exhibit a smooth memory type switching. Further, the switching voltages are found to decrease almost linearly with Sb content, which indicates that the metallicity of the dopant plays a dominant role in this system compared to network connectivity/rigidity. The thickness dependence of switching voltage (Vth) indicates a clear thermal origin for the switching mechanism. The temperature variation of switching voltages reveals that the Si15Te85-xSbx glasses studied have a moderate thermal stability. © 2009 Elsevier B.V. All rights reserved.Item Crystallization kinetics of Si20Te80?xBix (0???x???3) chalcogenide glasses(Elsevier Ltd, 2019) Fernandes, B.J.; Ramesh, K.; Udayashankar, N.K.In this report, we investigate the crystallization kinetics of Si20Te80?xBix (0 ? x ? 3) chalcogenide glassy systems using differential scanning calorimetry (DSC) technique. Systematic studies are carried out in order to understand the variation of thermal parameters such as glass transition temperature (Tg), onset crystallization temperature (Tc) and peak crystallization temperature (Tp) as a function of composition. Activation energy for glass transition (Eg) and crystallization (Ec) has been calculated based on the relevant statistical methods. Furthermore, thermal parameters such as change in specific heat (?Cp), fragility index (F), thermal stability (?T)& (S), enthalpy (?Hc), entropy (?S) are deduced to interpret distinct material behaviour as a function of composition. Structural evaluation like thermal devitrification studies elucidate the restricted glass formability of the studied glass system. Conclusively, a relationship has been established between the obtained thermal parameters and electrical switching characteristics. © 2019 Elsevier B.V.Item Investigation of Indium doped Se-Te bulk chalcogenide glasses for electrical switching and phase changing applications(Elsevier Ltd, 2024) Joshi, S.; Rodney, J.D.; James, A.; Behera, P.K.; Udayashankar, N.K.Recently, Metal-doped Se-Te chalcogenides have gained a lot of interest due to their unique capacity for electrical switching, which makes them desirable for electronic applications. This study examines the electrical switching characteristics of bulk Se86−xTe14Inx (0 ≤ x ≤ 6) amorphous alloys produced by the conventional melt-mix-quench process. The samples with an Indium atomic percentage between 2 to 6 exhibited a remarkable transition from a highly resistive to a low resistive state when subjected to an electric field with a current of 1 mA, displaying quick and reversible switching behaviour. The threshold voltage (Vth) significantly dropped from 410.6 V to 49.2 V with an increase in Indium concentration. Additionally, above the specific current threshold, these bulk glasses demonstrated memory-type switching, demonstrating their potential for data storage applications. To comprehend the trend of glass forming ability, thermal stability range and Hruby's glass stability parameters, with their compositional dependency, Differential Scanning Calorimetry (DSC) was utilized. The sample Se80Te14In6 emerged to be the fastest phase-changing material, with a memory switching current threshold of Ith = 1.3 mA and a threshold voltage value of 49.2 V. To study the formation of crystallites in Se-Te-In alloy, X-ray diffraction patterns of pristine glass and the annealed sample were examined. Furthermore, temperature-dependent conductivity investigations showed a sharp rise in conductivity once the process crystallization begins (Tx), and also the threshold voltage (Vth) of the samples decreased linearly with rising temperature. Overall, this study provides valuable insights into the electrical switching behaviour and thermal properties of Se-Te-In chalcogenide glasses, enhancing their suitability in electronic devices. © 2024 Elsevier B.V.Item Tunable electrode-dependent switching characteristics of Se-Te-In chalcogenide thin films(Springer, 2024) Joshi, S.; Udayashankar, N.K.Chalcogenide glasses have garnered significant interest as potential materials for the creation of high-density, three-dimensional stackable cross-point array structures, particularly for memory devices. Chalcogenide glasses have emerged as promising candidates for high-density, three-dimensional stackable cross-point array structures. In this study, we delve into the intricate electrical switching behaviour of Se86−xTe14Inx (x = 0, 2, 4, 6) chalcogenide glasses in the form of thin films, employing Aluminium (Al) as the top and bottom electrodes. Exhibiting the remarkable phase-changing characteristics of the material, the films showed memory-type switching behaviour. Remarkably, with an incremental change in Indium concentration from 0 to 6%, a linear reduction in the threshold voltage (Vth) from 12.75 to 4.80 V was observed, underscoring the tunability of switching properties with respect to compositional variations. When the Al top electrode was substituted with Silver (Ag) the thin films’ electrical behaviour changed and this alteration instigated a shift in the switching mechanism. The films changed their characteristics from memory to threshold-switching behaviour, presenting a unique phenomenon in the realm of Se-Te-based chalcogenide glassy alloys. The presence of an active electrode (Ag) at the top facilitated the formation of temporary Ag filaments, making the device a programmable metallization cell (PMC) with remarkable threshold-switching capabilities with higher selectivity (∼ 5 × 103) and endurance of 104 cycles. The observed tunable attributes, contingent on the precise adjustment of Indium concentration and film thickness, underscore the immense potential of these films as highly efficient and adaptable unidirectional selectors and memory devices. © The Author(s), under exclusive licence to Springer Science+Business Media, LLC, part of Springer Nature 2024.Item Peculiarities of Electrical Switching and Phase Transition Dynamics in Bismuth-Infused Se-Te Chalcogenide Glasses: From Bulk to Thin Film Devices(American Chemical Society, 2024) Joshi, S.; Rodney, J.D.; Udayashankar, N.K.Herein, the electrical switching behavior of both bulk and thin film forms of Se86-xTe14Bix (0 ≤ x ≤ 4) chalcogenide glasses was investigated. The melt-quench-derived glasses were found to be amorphous, and the switching behavior exhibited a threshold-type response below a certain current limit (Ith) for bismuth (Bi)-doped bulk samples. Interestingly, as current levels surpassed this threshold, a noteworthy change occurred in the switching behavior, converting it into a memory-type response. The threshold voltage (Vth) exhibited a decreasing trend from ∼228 V to ∼36 V with an increasing Bi content, and differential scanning calorimetry (DSC) was utilized to study the phase transition phenomena and thermal stability of the amorphous glasses. These DSC results unequivocally confirmed that the transition from amorphous to crystalline phase occurred readily and at lower temperatures in the Se82Te14Bi4 composition. Furthermore, annealing studies were carried out to gain insight into the phase transformations that occur when the material makes the transition from an amorphous to a crystalline state. Subsequently, the same melt-quench-derived glasses were deposited as a thin film using physical vapor deposition (PVD) into a three-layered Al/Se-Te-Bi/Al device, and the memory switching voltage experienced a remarkable drop to 2.88 V compared to the bulk material. This exploration sheds light on the captivating electrical switching behavior of Se86-xTe14Bix chalcogenide glasses and holds promise for potential applications spanning the realm of emerging electronics and phase change material (PCM) devices. © 2024 American Chemical Society.