Faculty Publications
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Item The p-type doping of vacuum deposited ZnTe thin films with bismuth by a new technique of using nano-spheres(Elsevier Ltd, 2010) Rao, K.G.; Shivakumar, G.K.; Kasturi, V.B.The present paper reports the successful doping of vacuum evaporated zinc telluride (ZnTe) thin films with bismuth by a new technique of using nano-spheres. The discontinuous films of bismuth (the dopant material), containing bismuth in the form of nano-spheres, were prepared by vacuum evaporation and the ZnTe films were then deposited on top of them. The scanning electron microscopy (SEM) and X-ray diffraction (XRD) techniques were used to ascertain the formation of discontinuous bismuth films and the proper diffusion of bismuth in ZnTe films, respectively. After doping, the carrier concentration of the ZnTe films was found to increase by an order of the magnitude. The electrical conductivity also improved significantly. The photoconductivity and photo-response properties of the doped films were also analysed. © 2010 Elsevier B.V. All rights reserved.Item Properties of ZnO:Bi thin films prepared by spray pyrolysis technique(Elsevier Ltd, 2013) Sadananda Kumar, N.; Bangera, K.V.; Anandan, C.; Shivakumar, G.K.Undoped and Bi doped zinc oxide thin films were deposited on glass substrate at 450 °C using spray pyrolysis technique. The X-ray diffraction studies shows that Bi doped ZnO films are polycrystalline hexagonal structure with a preferred orientation along (101) direction. Crystallites size of the films decreases with increasing doping concentration. Scanning electron microscope image shows change in the surface morphology. The composition of Zn, O and Bi elements in the undoped and Bi doped ZnO films were investigated by X-ray photoelectron spectroscopy. Bi doped ZnO thin films show a transparency nearly 75% in the visible region. The optical band gap of ZnO thin films reduces from 3.25 eV to 3.12 eV with an increase in Bi concentration from 0 to 5at.% respectively. Electrical conductivity of ZnO thin films increased from 0.156 to 6.02S/cm with increasing Bi dopant concentration from 0% to 5% respectively. © 2013 Elsevier B.V. All rights reserved.Item Study of the doping of thermally evaporated zinc oxide thin films with indium and indium oxide(Springer Nature, 2013) Palimar, S.; Bangera, K.V.; Shivakumar, G.K.The present paper reports observations made on investigations carried out to study structural, optical and electrical properties of thermally evaporated ZnO thin films and their modulations on doping with metallic indium and indium oxide separately. ZnO thin film in the undoped state is found to have a very good conductivity of 90 ?–1 cm–1 with an excellent transmittance of up to 90 % in the visible region. After doping with metallic indium, the conductivity of the film is found to be 580 ?–1 cm–1, whereas the conductivity of indium oxide-doped films is increased up to 3.5 × 103 ?–1 cm–1. Further, the optical band gap of the ZnO thin film is widened from 3.26 to 3.3 eV when doped with indium oxide and with metallic indium it decreases to 3.2 eV. There is no considerable change in the transmittance of the films after doping. All undoped and doped films were amorphous in nature with smooth and flat surface without significant modifications due to doping. © 2012, The Author(s).Item Effect of annealing on the properties of Bi doped ZnO thin films grown by spray pyrolysis technique(Academic Press, 2014) Sadananda Kumar, N.; Bangera, K.V.; Shivakumar, G.K.The effect of annealing temperature on the structural, optical and electrical properties of transparent and conducting Bi doped ZnO (BZO) films deposited on glass substrate by spray pyrolysis technique was investigated. The BZO thin films were annealed in the temperature range from 450 °C to 550°C for 4 h in air atmosphere. The grain size of the BZO films increased with increasing annealing temperature. The annealed BZO films were electrically stable and there was a drastic change in the electrical conductivity after annealing. The films annealed at 500°C showed better conductivity and optical transmittance. © 2014 Elsevier Ltd. All rights reserved.Item Enhanced gas sensing properties of indium doped ZnO thin films(Academic Press, 2018) Bharath, S.P.; Bangera, K.V.; Shivakumar, G.K.Indium doped ZnO (InxZn1-xO, 0 ? x ? 0.05) thin films were deposited on to soda lime glass substrate by employing spray pyrolysis as deposition technique. Effect of doping concentration on characteristics of thin films were examined by XRD, SEM, UV-Visible spectroscopy, electrical and gas sensing measurements. XRD analysis demonstrates polycrystalline nature of thin films and also shows the shift in orientation from (002) to (101) crystal plane with increase in indium doping concentration. Surface morphological analysis shows the formation of homogeneous particle like nanostructures. Optical transmittance determined from UV-Visible spectroscopy was in the range of 80–95%, which was decreasing with increase in indium doping concentration. Maximum electrical conductivity was achieved at an optimal indium doping concentration of 3 at.%. The gas sensing properties were examined for different concentration of volatile organic compounds like acetone, ethanol and methanol for different doping levels. In0.03Zn0.97O thin films showed good sensitivity towards ethanol, with sensitivity of 30% towards 25 ppm of ethanol. © 2018 Elsevier LtdItem Preparation of thermally deposited Cux(ZnS)1-x thin films for opto-electronic devices(Elsevier Ltd, 2019) Barman, B.; Bangera, K.V.; Shivakumar, G.K.Zinc sulfide thin films have been doped with copper atoms to investigate their efficiency as transparent conductor layers. Cux(ZnS)1-x thin films were deposited on glass substrate using thermal evaporation technique by varying the Cu concentration (x = 0.01, 0.02, 0.03, 0.05, 0.10 and 0.25). The prepared thin films were characterized using XRD, FE-SEM, EDS and UV–Vis spectroscopy. The X-ray diffraction studies revealed that the films are crystalline in nature and well oriented along (111) direction with the cubic crystal structure. Crystallite size increases with increase in Cu concentration. FE-SEM studies showed that the films are homogenous and pin-hole free. All the films exhibited p-type conductivity. It was also observed that the band gap of the Cux(ZnS)1-x films vary from 3.48 eV to 2.60 eV when the copper content varies from 0 to 0.25. At a Cu concentration of x = 0.03, the hole conductivity increases to 1.9 × 103 S/m retaining an optical transparency of ?73% in the visible spectra. This combination of optical transparency and hole conductivity of Cux(ZnS)1-x thin films for such low Cu concentration is, to our knowledge, the best reported to date. © 2018Item Investigation of third-order nonlinear optical properties of nanostructured Ni-doped CdS thin films under continuous wave laser illumination(Springer, 2019) Bairy, R.; Arasalike, A.; Shivakumar, G.K.; Radhakrishnan, K.; Bhat K, U.K.We report the third-order nonlinear optical (NLO) properties and optical limiting (OL) thresholds of pure CdS and Ni-doped CdS thin films have been investigated with the Z-scan technique under continuous wave laser excitation. Nanocrystalline CdS thin films with various doping concentrations of Ni (0%, 1%, 3%, 5% and 10 at. %) are prepared by spray-pyrolysis technique. XRD patterns reveal that all the prepared films are polycrystalline and the incorporation of Ni does not lead to major changes in the crystalline phase of Cd1-xNixS thin films. The surface morphology of the prepared films is impacted by the Ni-doping and is indicated by Field Emission Scanning Electron Microscopy (FESEM) images. With an increase in Ni-doping concentration, the energy band-gap value decreased from 2.48 eV to 2.23 eV. From the Z-scan data, it is observed that the material show strong two-photon absorption (2PA) and with an increase in Ni-doping concentrations from 0 to 10 at. %, the nonlinear absorption coefficient (?) are enhanced from 0.92 x 10-5 to 4.46 x 10-5 (cm W-1), nonlinear refractive index (n2) from 0.2967 x 10-9 to 0.1297 x 10-8 (cm2 W-1) and thereby the third-order NLO susceptibility (?(3)) values also increased from 1.7075 x 10-6 to 7.4743 x 10-6 (esu). OL characteristics of the prepared films are studied at the experimental wavelength. The results propose that the Cd1-xNixS film is a capable material for nonlinear optical devices at 532 nm and optical power limiting applications. © Springer Science+Business Media, LLC, part of Springer Nature 2019.