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Test Methodology for Analysis of Coexistent Logic-Level Faults in NoC Channels
(Institute of Electrical and Electronics Engineers Inc., 2020) Bhowmik, B.; Biswas, S.; Deka, J.K.
With the continuous growth in wire density, the reliability has become a dominant burden while channels of a modern NoC are exposed to various faults. A key requirement for the NoC is therefore to propose a mechanism that can account for a channel fault since it significantly impacts NoC performance. This paper presents a distributed test strategy that detects and diagnoses logic-level faults coexist in NoC channels and deeply analyze the severe impact of these faults on network performance. Fault coexistence in channels makes a fraction undetectable and is addressed here. Simulation results demonstrate the effectiveness of the proposed strategy. Â© 2020 IEEE.