Faculty Publications
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Item Effect of indium content on the characteristics of indium tin oxide thin films(Institute of Physics Publishing helen.craven@iop.org, 2018) Navya, K.; Bharath, S.P.; Bangera, K.V.; Shivakumar, G.K.Transparent IxT1-xO (x = 0 to 1) alloyed thin films were deposited by spray pyrolysis technique at a substrate temperature of 400 °C. The effect of incorporation of indium on structural, optical and electrical properties of tin oxide thin films were studied. Characterization of thin films was carried out using x-ray diffraction (XRD), scanning electron microscopy (SEM), energy dispersive x-ray spectroscopy (EDAX), UV-Visible absorption spectroscopy. XRD results revealed that IxT1-xO thin films were polycrystalline in nature with good crystallinity. Incorporation of indium effectively modifies the surface morphology of the films. The band gap was varied from 3.7 eV to 3 eV. Maximum electrical conductivity of 44.52 × 103 ?-1 m-1 and transmittance of 90% is obtained for I0.5T0.5O films, hence can be used as highly transparent and conducting electrodes. © 2018 IOP Publishing Ltd.Item A comprehensive study on the structural, morphological, compositional and optical properties of ZnxCd1-xS thin films(Institute of Physics Publishing helen.craven@iop.org, 2019) Barman, B.; Bangera, K.V.; Shivakumar, G.K.The absorption loss in cadmium sulfide (CdS) thin films which are widely used as a window layer in a photovoltaic cell limits the efficiency of the device. This issue can be addressed by ZnxCd1-xS thin films due to its tunable band gap nature. Herein, the various composition of ZnxCd1-xS (x=0, 0.15, 0.30, 0.45, 0.70, 0.85, 1) thin films were grown by a vacuum thermal evaporation technique and the characteristics of the films were investigated by varying the composition 'x'. The x-ray diffraction (XRD) studies displayed that the as-deposited films consist of diffraction peaks from both CdS and ZnS lattice. The formation of ternary ZnxCd1-xS films was verified when the deposited films were subjected to an annealing treatment. The morphology of the films was analyzed using a scanning electron microscope (SEM) and it was observed that the films are uniform, homogeneous and free from any pin-holes and cracks. The presence of Zn, Cd and S elements were quantized using an energy dispersive spectroscopy. Optical studies showed a successful non-linear band gap engineering (2.42-3.49 eV) for the deposited ZnxCd1-xS thin films. All films showed a very high optical transmittance of above 70% in the visible wavelength region. © 2020 IOP Publishing Ltd.