Effect of indium content on the characteristics of indium tin oxide thin films
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Date
2018
Journal Title
Journal ISSN
Volume Title
Publisher
Institute of Physics Publishing helen.craven@iop.org
Abstract
Transparent I<inf>x</inf>T<inf>1-x</inf>O (x = 0 to 1) alloyed thin films were deposited by spray pyrolysis technique at a substrate temperature of 400 °C. The effect of incorporation of indium on structural, optical and electrical properties of tin oxide thin films were studied. Characterization of thin films was carried out using x-ray diffraction (XRD), scanning electron microscopy (SEM), energy dispersive x-ray spectroscopy (EDAX), UV-Visible absorption spectroscopy. XRD results revealed that I<inf>x</inf>T<inf>1-x</inf>O thin films were polycrystalline in nature with good crystallinity. Incorporation of indium effectively modifies the surface morphology of the films. The band gap was varied from 3.7 eV to 3 eV. Maximum electrical conductivity of 44.52 × 103 ?-1 m-1 and transmittance of 90% is obtained for I<inf>0.5</inf>T<inf>0.5</inf>O films, hence can be used as highly transparent and conducting electrodes. © 2018 IOP Publishing Ltd.
Description
Keywords
Absorption spectroscopy, Alloying, Conductive films, Crystallinity, Energy dispersive spectroscopy, Energy gap, Indium compounds, Morphology, Oxide films, Scanning electron microscopy, Spray pyrolysis, Surface morphology, Tin oxides, Transparent electrodes, X ray diffraction, Band gap engineering, Conducting electrodes, Electrical conductivity, Energy dispersive X ray spectroscopy, Indium tin oxide thin films, Optical and electrical properties, Spray-pyrolysis techniques, UV-visible absorption spectroscopy, Thin films
Citation
Materials Research Express, 2018, 5, 9, pp. -