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Item Growth and morphology of mixed K1-x(NH4)xH2PO4 crystals(Elsevier Ltd, 2010) Shenoy, P.; Bangera, K.V.; Shivakumar, G.K.Mixed crystals of ammonium dihydrogen orthophosphate (ADP) and potassium dihydrogen orthophosphate (KDP), i.e., potassium ammonium dihydrogen phosphate, K1-x(NH4)xH2PO4 have been grown by slow evaporation from the supersaturated solution at an ambient temperature 26 ± 1 °C for ammonium concentration x in the range 0.0 ? x ? 1.0. The morphology changes from tetragonal prism to needles when the concentration of either of the components approaches that of the other. Induction periods were measured for various compositions of mixed crystals of ADP and KDP by the direct vision method. Crystal compositions were determined by flame atomic absorption spectroscopy and also by chemical analysis. Results of the X-ray analysis of the grown crystals are also reported. Maximum size of the grown mixed crystal was around 16 × 10 × 4 mm3. © 2010 Elsevier B.V. All rights reserved.Item Growth and thermal studies on pure ADP, KDP and mixed K 1-x(NH4)xH2PO4 crystals(2010) Shenoy, P.; Bangera, K.V.; Shivakumar, G.K.The investigations on the formation of mixed crystals of ammonium dihydrogen orthophosphate (ADP) and potassium dihydrogen orthophosphate (KDP) i.e. potassium ammonium dihydrogen phosphate, K1-x(NH 4)xH2PO4 have been presented in this paper. Pure and mixed crystals of ADP and KDP have been grown by slow evaporation technique from the supersaturated solution at an ambient temperature 26±1 °C for ammonium concentration x in the range 0.0 ? × ? 1.0 in the case of mixed crystals. Crystal compositions were determined by flame atomic absorption spectroscopy and chemical analysis. The results of the X-ray analysis of the grown crystals are also reported. Thermogravimetric analysis (TGA) and differential thermal analysis (DTA) were used to study the kinetic process of dehydration and the high temperature phase behaviour. DTA showed the distinct thermal events attributed to dehydration of ADP, KDP and K1-x(NH4)xH2PO4. The results of thermal analysis and chemical analysis are consistent with each other. © 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.Item Effect of indium content on the characteristics of indium tin oxide thin films(Institute of Physics Publishing helen.craven@iop.org, 2018) Navya, K.; Bharath, S.P.; Bangera, K.V.; Shivakumar, G.K.Transparent IxT1-xO (x = 0 to 1) alloyed thin films were deposited by spray pyrolysis technique at a substrate temperature of 400 °C. The effect of incorporation of indium on structural, optical and electrical properties of tin oxide thin films were studied. Characterization of thin films was carried out using x-ray diffraction (XRD), scanning electron microscopy (SEM), energy dispersive x-ray spectroscopy (EDAX), UV-Visible absorption spectroscopy. XRD results revealed that IxT1-xO thin films were polycrystalline in nature with good crystallinity. Incorporation of indium effectively modifies the surface morphology of the films. The band gap was varied from 3.7 eV to 3 eV. Maximum electrical conductivity of 44.52 × 103 ?-1 m-1 and transmittance of 90% is obtained for I0.5T0.5O films, hence can be used as highly transparent and conducting electrodes. © 2018 IOP Publishing Ltd.