Browsing by Author "Dayal, V."

Filter results by typing the first few letters
Now showing 1 - 1 of 1
  • No Thumbnail Available
    Item
    Automated low-temperature resistivity measurement setup: Design and fabrication
    (Elsevier Ltd, 2021) Saw, A.K.; Channagoudra, G.; Pethker, T.; Gangadharan, K.V.; Dayal, V.
    In this paper we present, the design and working of the automated low-temperature four-probe DC electrical resistivity measurement setup developed in-house. This setup measures the resistance/resistivity in the temperature range 300 K to 80 K. The overall arrangement comprises a low-temperature four-probe sample holder, Lakeshore 335 Temperature controller, Keithley Delta mode 6221 AC/DC source, 2182A Nano-voltmeter, and a vacuum system. For the measurement of sample temperature Pt-100 sensor is employed. The IEEE-488.2 card and GPIB cables link the mentioned instruments to the computer. The licenced Lab-VIEW 2018 software is employed to build the control programme. The established setup can measure the resistance of both bulk and thin-film samples, making it versatile. A test measurement on well-characterized ceramic Pr0.67Sr0.33MnO3perovskite oxide synthesized using a solid-state route has been carried out in the newly installed setup. The data acquired from the installed setup and beforehand resistance measurement carried out in-house low-temperature resistance measurement setup at UGC-DAE-Consortium for scientific research, Indore conceded a precision for both temperature and resistance. © 2021 Elsevier Ltd. All rights reserved.