Statistics for Impact of Gate Oxide Thickness Variation on the On-state Safe Operating Area and FoM of SOI-Junctionless FinFET considering the Self-heating Effects
Total visits
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| Impact of Gate Oxide Thickness Variation on the On-state Safe Operating Area and FoM of SOI-Junctionless FinFET considering the Self-heating Effects | 0 |
Total visits per month
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| October 2025 | 0 |
| November 2025 | 0 |
| December 2025 | 0 |
| January 2026 | 0 |
| February 2026 | 0 |
| March 2026 | 0 |
| April 2026 | 0 |