SiC particulate reinforced A356 Al metal matrix composites were laser treated using pulsed Nd-YAG laser beam. The processing was carried out in air atmosphere at varying pulse energy (5 to 20 J) and scan rates (30 to 150 mm/sec). The samples were cut perpendicular to the track and they were characterized using optical microscopy, scanning electron microscopy and X-ray diffraction. Microstructure of laser treated region consists of regular succession of coarse and fine microstructure signifying the presence of low velocity bands. Transition from cellular/columnar dendritic to equiaxed dendritic structure has been observed. Microstructure of samples laser treated with specific energy greater than 13 kJ/cm2 show presence of Al <inf>4</inf>C<inf>3</inf> platelets. © 2004 Kluwer Academic Publishers.

Bhat, K.U.Surappa, M.K.2026-02-05MicrostrucJournal of Materials Science, 2004, 39, 8, pp. 2795-2799222461https://doi.org/10.1023/B:JMSC.0000021456.69791.08https://idr.nitk.ac.in/handle/123456789/279502004Ceramic materialsEnergy dispersive spectroscopyLaser applicationsLaser beamsMicrostructureNeodymium lasersScanning electron microscopySilicon compoundsSolidificationSurface treatmentX ray diffraction analysisDendritic structureLaser surface treatmentPulse energyAluminumSiC particulate reinforced A356 Al metal matrix composites were laser treated using pulsed Nd-YAG laser beam. The processing was carried out in air atmosphere at varying pulse energy (5 to 20 J) and scan rates (30 to 150 mm/sec). The samples were cut perpendicular to the track and they were characterized using optical microscopy, scanning electron microscopy and X-ray diffraction. Microstructure of laser treated region consists of regular succession of coarse and fine microstructure signifying the presence of low velocity bands. Transition from cellular/columnar dendritic to equiaxed dendritic structure has been observed. Microstructure of samples laser treated with specific energy greater than 13 kJ/cm2 show presence of Al <inf>4</inf>C<inf>3</inf> platelets. © 2004 Kluwer Academic Publishers.