Magisetty, R.N R, H.Shukla, A.Shunmugam, R.Balasubramanian, B.2026-02-052020Polymer-Plastics Technology and Materials, 2020, 59, 18, pp. 2018-202625740881https://doi.org/10.1080/25740881.2020.1784217https://idr.nitk.ac.in/handle/123456789/23544Impedance spectroscopy-based electrical measurements were conducted on different molecular weight (MW) Poly(1,6-heptadiyne)s (PHDs) embedded PHD/NiFe<inf>2</inf>O<inf>4</inf> nanocomposites. Nanocomposites conductivity result demonstrated the conductivities of around (Formula presented.) (nanocomposite Root mean square (RMS) current is 12–15 times greater than DC current of PHDs at 27° C). Additionally, dielectric loss and capacitance characteristics suggested the nanocomposite (4500 MW PHD) device quality factor is 35.7 at 1 kHz, which is ~13.89 times superior than that of NiFe<inf>2</inf>O<inf>4</inf> alone sample, also ‘Q’ value for highest MW PHD nanocomposite is 50% enhanced than NiFe<inf>2</inf>O<inf>4</inf>. Moreover, the capacitance result suggested the 12400 MW PHD nanocomposite nearly frequency-independent capacitance (15–20pF) over a frequency range of 500 Hz–500 kHz. © 2020 Taylor & Francis.CapacitanceDielectric lossesNanocompositesNickel compoundsCapacitance characteristicsDevice quality factorElectrical measurementFrequency independentFrequency rangesImpedance spectroscopyMiniaturized electronicsRoot Mean SquareIron compounds