Manukrishna, V.R.Nikhil, K.S.2026-02-032025Modelling and Simulation in Materials Science and Engineering, 2025, 33, 2, pp. -9650393https://doi.org/10.1088/1361-651X/ada819https://idr.nitk.ac.in/handle/123456789/20370A static current model of ?—Gallium Oxide (?-Ga<inf>2</inf>O<inf>3</inf>) based double gate drain extended junction less field effect transistor (DG-DeJLFET) is proposed. The model consists of two voltage-controlled current sources connected in series. One of the current sources accounts for the operation of the junction less field effect transistor whereas, the other takes care of the drift region current. The model is formulated by considering the mobility degradation caused by moderately elevated electric fields. A parameter extraction methodology for this model is also proposed by considering the dominance of certain parameters in the specific regions of operation. In general, the parameter extraction technique is based on the variation in the device current behavior at moderate electric fields. The proposed parameter extraction methodology is validated by comparing the results with the data obtained from the TCAD simulation. © 2025 IOP Publishing Ltd. All rights, including for text and data mining, AI training, and similar technologies, are reserved.Junction gate field effect transistorsSurface dischargesCurrent modelingDouble gate drain extended junction less field effect transistorDouble-gateField-effect transistorGate drainMobility degradationParameter extraction methodologyParameters extractionStatic current modelStatic currents?-ga2O3Gallium compounds