Saw, A.K.Channagoudra, G.Pethker, T.Gangadharan, K.V.Dayal, V.2026-02-062021Materials Today: Proceedings, 2021, Vol.47, , p. 1670-1675https://doi.org/10.1016/j.matpr.2021.05.341https://idr.nitk.ac.in/handle/123456789/30325In this paper we present, the design and working of the automated low-temperature four-probe DC electrical resistivity measurement setup developed in-house. This setup measures the resistance/resistivity in the temperature range 300 K to 80 K. The overall arrangement comprises a low-temperature four-probe sample holder, Lakeshore 335 Temperature controller, Keithley Delta mode 6221 AC/DC source, 2182A Nano-voltmeter, and a vacuum system. For the measurement of sample temperature Pt-100 sensor is employed. The IEEE-488.2 card and GPIB cables link the mentioned instruments to the computer. The licenced Lab-VIEW 2018 software is employed to build the control programme. The established setup can measure the resistance of both bulk and thin-film samples, making it versatile. A test measurement on well-characterized ceramic Pr<inf>0.67</inf>Sr<inf>0.33</inf>MnO<inf>3</inf>perovskite oxide synthesized using a solid-state route has been carried out in the newly installed setup. The data acquired from the installed setup and beforehand resistance measurement carried out in-house low-temperature resistance measurement setup at UGC-DAE-Consortium for scientific research, Indore conceded a precision for both temperature and resistance. © 2021 Elsevier Ltd. All rights reserved.Four-probe techniqueLabVIEWLow-temperature resistivity setupPerovskite manganites