Bhowmik, B.Biswas, S.Deka, J.K.Bhattacharya, B.B.2026-02-062020Proceedings of IEEE Computer Society Annual Symposium on VLSI, ISVLSI, 2020, Vol.2020-July, , p. 200-20521593469https://doi.org/10.1109/ISVLSI49217.2020.00044https://idr.nitk.ac.in/handle/123456789/30680Networks-on-chip (NoCs) provide the essential communication infrastructure for building today's on-chip multiprocessors. Albeit mesh is commonly used as the underlying interconnection architecture, other regular topologies such as octagons or spidergons, find recent applications to hybrid, small-world, and smart networks. Aggressive technology scaling, however, makes NoCs susceptible to manufacturing defects and causes failures in their operations. This paper presents a distributed, on-line built-in-self-test (BIST) mechanism that targets open faults on communication channels in an octagon NoC. We introduce a novel test scheduling scheme that exploits the knowledge of multithreading for reducing the overall test time with minimal degradation of performance. We evaluate the proposed test scheme for a 16-bit octagon NoC and report experimental results. © 2020 IEEE.Distributed fault detectionNetworks-on-chipOpen-channel faultsReliability and performance