Face image retrieval based on probe sketch using SIFT feature descriptors

dc.contributor.authorRakesh, S.
dc.contributor.authorAtal, K.
dc.contributor.authorArora, A.
dc.contributor.authorPurkait, P.
dc.contributor.authorChanda, B.
dc.date.accessioned2026-02-06T06:40:28Z
dc.date.issued2012
dc.description.abstractThis paper presents a feature-based method for matching facial sketch images to face photographs. Earlier approaches calculated descriptors over the whole image and used some transformation and matched them by some classifiers. We present an idea, where descriptors are calculated at selected discrete points (eyes, nose, ears...). This allows us to compare only prominent features. We use SIFT (Scale Invariant Feature Transform) to extract feature descriptors at the annotated points in the sketches and experiment with various methods to retrieve photos. Experimental results demonstrate appreciable matching performances using the presented feature-based methods at a low computational cost. © 2012 Springer-Verlag.
dc.identifier.citationLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics), 2012, Vol.7143 LNCS, , p. 50-57
dc.identifier.issn3029743
dc.identifier.urihttps://doi.org/10.1007/978-3-642-27387-2_7
dc.identifier.urihttps://idr.nitk.ac.in/handle/123456789/32945
dc.subjectannotated points
dc.subjectForensic sketch
dc.subjectimage registration
dc.subjectSIFT feature descriptors
dc.titleFace image retrieval based on probe sketch using SIFT feature descriptors

Files