Growth and temperature dependent electrical properties of ZnO nanostructures

dc.contributor.authorSanthosh Kumar, A.
dc.contributor.authorNagaraja, K.K.
dc.contributor.authorNagaraja, H.S.
dc.date.accessioned2026-02-06T06:40:09Z
dc.date.issued2013
dc.description.abstractZinc oxide (ZnO) nanostructured films are grown using Polyvinyal alcohol (PVA)-citric acid modified sol gel process and the effect of (0, 1, and 2Wt%) PVA content on growth, crystallanity, microstructure and electrical properties are investigated. The XRD patterns confirm that the films are polycrystalline nature. 1 Wt% assisted grown samples are found to be good crystallanity with (002) preferred orientation. The SEM micrographs confirm that the 1 Wt% PVA assisted grown films are composed of vertically oriented ∼1.2 μm length nanorods. The temperature dependent electrical resistivity of the films has been measured using the four-probe method. The electrical resistivity found to be 7.08 ω-cm at room temperature for vertically oriented nanorods composed films, which are grown using 1Wt% PVA. © 2013 AIP Publishing LLC.
dc.identifier.citationAIP Conference Proceedings, 2013, Vol.1536, , p. 263-264
dc.identifier.issn0094243X
dc.identifier.urihttps://doi.org/10.1063/1.4810201
dc.identifier.urihttps://idr.nitk.ac.in/handle/123456789/32730
dc.subjectCrystallinity
dc.subjectPVA
dc.subjectResistivity
dc.subjectTemperature
dc.titleGrowth and temperature dependent electrical properties of ZnO nanostructures

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