Rapid thermal processing for ULSI applications: An overview

dc.contributor.authorReid, K.G.
dc.contributor.authorSitaram, A.R.
dc.date.accessioned2020-03-31T08:42:04Z
dc.date.available2020-03-31T08:42:04Z
dc.date.issued1996
dc.description.abstractRapid thermal processing (RTP) technology has made significant advances in recent years. Dynamic feedback, multizone control, and axially symmetric chamber design have helped to improve manufacturability and process control. This article will discuss historical and state-of-the-art RTP technology. Throughput and cycle time for conventional CMOS processes in RTP and batch furnaces will be compared. Cost of ownership (COO) for thermal processors will be discussed, highlighting the importance of throughput.en_US
dc.identifier.citationSolid State Technology, 1996, Vol.39, 2, pp.63-74en_US
dc.identifier.urihttps://idr.nitk.ac.in/handle/123456789/12742
dc.titleRapid thermal processing for ULSI applications: An overviewen_US
dc.typeArticleen_US

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