On the Design of SSRS and RS Codes for Enhancing the Integrity of Information Storage in NAND Flash Memories

dc.contributor.authorAchala, G.
dc.contributor.authorShripathi Acharya, U.S.
dc.contributor.authorSrihari, P.
dc.date.accessioned2026-02-04T12:27:05Z
dc.date.issued2023
dc.description.abstractThe revolution in the field of information processing systems has created a huge demand for reliable and enhanced data storage capabilities. This demand is being met by advances in channel coding algorithms along with upward scaling of the capacities of hardware devices. NAND Flash memory is a type of non-volatile memory. Scaling of the size of flash memories from Single Level Cell (SLC) devices to Multilevel cell (MLC) devices has increased the storage capacity. However, these multi-bit per cell architectures are characterized by significantly higher Raw Bit Error Rate (RBER) values when compared with SLC architectures. The requirement of low Undetected Bit Error Rate (UBER) values has motivated us to synthesize powerful channel codes for enhancing the integrity of information Storage in multi-level NAND Flash Memory devices. This paper describes the synthesis of novel Subfield Subcodes of Reed Solomon Codes (SSRS) and Reed-Solomon (RS) codes which are matched to multi-bit per cell architectures. UBER values have been calculated for each of the synthesized codes described in this paper. This allows the determination of the performance and the improvement in data storage integrity brought by using these codes. We have shown that the synthesized SSRS and RS codes can provide very low UBER even when the corresponding RBER values are appreciable. As RS codes permit the detection and correction of a greater number of errors for a given code length, their performance is superior to that of SSRS codes. This improved performance is obtained at the cost of greater complexity of encoding and decoding processes. © 2013 IEEE.
dc.identifier.citationIEEE Access, 2023, 11, , pp. 73198-73217
dc.identifier.urihttps://doi.org/10.1109/ACCESS.2023.3294544
dc.identifier.urihttps://idr.nitk.ac.in/handle/123456789/22123
dc.publisherInstitute of Electrical and Electronics Engineers Inc.
dc.subjectBit error rate
dc.subjectBlock codes
dc.subjectCells
dc.subjectChannel coding
dc.subjectCytology
dc.subjectFlash memory
dc.subjectMemory architecture
dc.subjectNAND circuits
dc.subjectOptical communication
dc.subjectBit-error rate
dc.subjectCode
dc.subjectError correction codes
dc.subjectNAND Flash
dc.subjectRaw bit error rates
dc.subjectReed -Solomon code
dc.subjectSubfield subcode of reed solomon code code
dc.subjectSubfield subcodes
dc.subjectSymbol
dc.subjectUndetected bit error rate
dc.subjectReed-Solomon codes
dc.titleOn the Design of SSRS and RS Codes for Enhancing the Integrity of Information Storage in NAND Flash Memories

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