Library Characterization: Noise and Delay Modeling

Abstract

In this paper, we propose new models for noise and delay of gates, which are two significant p arameters for characterizing a cell library. Supply noise and coupling noise contribute greatly to overall noise in a circuit. With scaling down of technology, coupling noise has been very significant. Hence, it is necessary to model this noise for analysis purposes. Modeling involves characterization of significant n oise parameters such as Noise propagation characteristics and Noise Immune Characteristics. Noise Immunity curve characterized using Noise bump height only method leads to fast modeling. We propose a novel method for delay modeling using FFT spectrum of output signal. The cell delay characterization is done by extracting the relationship between delay and the width of the main lobe of FFT spectrum of the response of the system for a narrow input pulse. © 2018 IEEE.