Comparison of spreading behaviour and interfacial microstructure in Sn-0·7Cu, Sn-0·3Ag-0·7Cu and Sn-2·5Ag-0·5Cu lead free solder alloys on Fe-42Ni substrate
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Date
2013
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Maney Publishing michael.wagreich@univie.ac.at
Abstract
In the present work, spreading behaviour and development of interfacial microstructure in Sn- 0·7Cu, Sn-0·3Ag-0·7Cu and Sn-2·5Ag-0·5Cu lead free solder alloys on Fe-42Ni substrates having two different surface textures were investigated. Smooth textured surfaces yielded better wettability than rough surfaces particularly for Sn-0·7Cu solder alloy. Wettability of Sn-0·7Cu solder on rough textured surfaces was found to be poor compared to other solder alloys. Spreading of Sn-0·7Cu solder on substrate surface showed longer viscous regime, Sn-2·5Ag- 0·5Cu solder exhibited shortest viscous regime. Sn-0·3Ag-0·7 solder showed intermediate behaviour. Sn-Cu solder alloy exhibited needle and coarse shaped (Cu,Ni)<inf>6</inf>Sn<inf>5</inf> intermetallics at the interface and in the matrix of the solder alloy on smooth substrate, whereas on rough substrate, formation of only coarse shaped (Cu,Ni)<inf>6</inf>Sn<inf>5</inf> intermetallic compounds (IMCs) was observed. For Sn-0·3Ag-0·7Cu solder alloy, Fe-Ni-Sn and FeSn<inf>2</inf> IMCs identified at the interface. (Cu,Ni)<inf>6</inf>/Sn<inf>5</inf> IMCs were found to be less coarser than as observed at Sn-0·7Cu/substrate interface. Sn-2·5Ag-0·5Cu alloy exhibited (Cu,Ni) <inf>3</inf>Sn<inf>4</inf> and (Cu,Ni)<inf>6</inf> Sn<inf>5</inf> IMCs at the interface and in the bulk of solder alloy. © 2013 Institute of Materials, Minerals and Mining.
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Keywords
Binary alloys, Contact angle, Copper alloys, Interfaces (materials), Intermetallics, Iron alloys, Lead alloys, Lead-free solders, Microstructure, Nickel compounds, Substrates, Wetting, IMCs, Interfacial microstructure, Lead-free solder alloy, Rough substrates, Smooth substrates, Spread regimes, Substrate surface, Textured surface, Tin alloys
Citation
Materials Science and Technology (United Kingdom), 2013, 29, 4, pp. 464-473
