Observation of electrical threshold switching behavior and thermal crystallization in bulk Se86-xTe14Snx chalcogenide glasses

dc.contributor.authorJoshi, S.
dc.contributor.authorUdayashankar, N.K.
dc.date.accessioned2026-02-04T12:26:29Z
dc.date.issued2023
dc.description.abstractSelenium-rich chalcogenides have gained popularity as materials for selector devices due to their unique Ovonic Threshold Switching behavior. Bulk Se<inf>86-x</inf>Te<inf>14</inf>Sn<inf>x</inf> glassy alloys (0 ≤ x ≤ 6) were prepared through the traditional melt quenching method. The samples with Sn atomic percentage (x) = 3 to 6 are found to exhibit a rapid and reversible transition between a highly resistive and conductive state affected by an electric field. A remarkable decrement in threshold voltage (V<inf>th</inf>) from 453 V to 62 V has been observed with increase in the Tin content. Differential scanning calorimetry (DSC) analysis was carried out to understand the variation of Glass transition temperature (T<inf>g</inf>), Crystallization temperature (T<inf>c</inf>), and other important glass stability parameters and their compositional dependence. Se<inf>82</inf>Te<inf>14</inf>Sn<inf>4</inf> sample was found to be thermally most stable with Herby's parameter value (H<inf>R</inf>) of 0.3860 and a maximum number of switching cycles at room temperature. X-Ray diffraction patterns of annealed samples were compared with pristine glass to study the multi-phasic Se–Te–Sn alloy. Further, the threshold voltage (V<inf>th</inf>) and the number of threshold switching cycles are found to decrease with an increase in temperature till crystallization on-set temperature (T<inf>oc</inf>). The temperature-dependent conductivity studies showed an abrupt increase in the conductivity of the samples as the temperature crossed the crystallization onset temperature. © 2023 Elsevier Ltd and Techna Group S.r.l.
dc.identifier.citationCeramics International, 2023, 49, 11, pp. 16637-16646
dc.identifier.issn2728842
dc.identifier.urihttps://doi.org/10.1016/j.ceramint.2023.02.024
dc.identifier.urihttps://idr.nitk.ac.in/handle/123456789/21881
dc.publisherElsevier Ltd
dc.subjectChalcogenides
dc.subjectDifferential scanning calorimetry
dc.subjectElectric fields
dc.subjectGlass
dc.subjectGlass transition
dc.subjectPhase change materials
dc.subjectTellurium compounds
dc.subjectTin alloys
dc.subjectBehavior crystallizations
dc.subjectChalcogenide
dc.subjectElectrical switching
dc.subjectGlass materials
dc.subjectPhase Change
dc.subjectSwitching behaviors
dc.subjectSwitching cycles
dc.subjectThermal crystallization
dc.subjectThreshold switching
dc.subjectTin doping
dc.subjectThreshold voltage
dc.titleObservation of electrical threshold switching behavior and thermal crystallization in bulk Se86-xTe14Snx chalcogenide glasses

Files

Collections