Wetting behavior of solders

dc.contributor.authorKumar, G.
dc.contributor.authorPrabhu, K.N.
dc.date.accessioned2026-02-05T09:36:19Z
dc.date.issued2010
dc.description.abstractLead bearing solders have been used extensively in the assembly of modern electronic circuits. However, increasing environmental and health concerns about the toxicity of lead has led to the development of lead-free solders. Wetting of solders on surfaces is a complex and important phenomenon that affects the interfacial microstructure and hence the reliability of a solder joint. The solder material reacts with a small amount of the base metal and wets the metal by intermetallic compound (IMC) formation. The degree and rate of wetting are the two important parameters that characterize the wetting phenomenon. Contact angle is a measure of the degree of wetting or wettability of a surface by a liquid. Spreading kinetics in a given system is strongly affected by the experimental conditions. In reactive systems like soldering, wetting and chemical interfacial reactions are interrelated, and hence for successful modeling, it is essential to assess the effect of interfacial reactions on kinetics of wetting. Solder wetting necessarily involves the metallurgical reactions between the filler metal and the base metal. This interaction at the solder/base metal interface results in the formation of IMCs. During soldering an additional driving force besides the imbalance in interfacial energies originates from the interfacial reactions. The formation of IMC has significant influence on contact angle. The presence of IMCs (thin, continuous, and uniform layer) between solders and substrate metals is an essential requirement for good bonding. Optimum thickness of an IMC layer offers better wettability and an excellent solder joint reliability. However, due to their inherent brittle nature and tendency to generate structural defects, a too thick IMC layer at the interface may degrade the joint. In this paper, the factors affecting the wetting behavior of solders and evolution of interfacial microstructure are reviewed and discussed. Copyright © 2010 by ASTM International.
dc.identifier.citationJournal of ASTM International, 2010, 7, 5, pp. -
dc.identifier.urihttps://doi.org/10.1520/JAI103055
dc.identifier.urihttps://idr.nitk.ac.in/handle/123456789/27469
dc.subjectBase metals
dc.subjectDriving forces
dc.subjectElectronic circuits
dc.subjectExperimental conditions
dc.subjectHealth concerns
dc.subjectIMC
dc.subjectIMC layer
dc.subjectInterfacial microstructure
dc.subjectInterfacial reactions
dc.subjectIntermetallic compounds
dc.subjectLead-free solders
dc.subjectMetal interface
dc.subjectMetallurgical reaction
dc.subjectOptimum thickness
dc.subjectReactive system
dc.subjectSolder joint reliability
dc.subjectSolder joints
dc.subjectSolder material
dc.subjectSolder wetting
dc.subjectSpreading kinetics
dc.subjectStructural defect
dc.subjectSubstrate metals
dc.subjectUniform layer
dc.subjectWetting behavior
dc.subjectContact angle
dc.subjectMetals
dc.subjectMicrostructure
dc.subjectPhase interfaces
dc.subjectSemiconducting intermetallics
dc.subjectSoldering
dc.subjectSoldering alloys
dc.subjectWetting
dc.subjectLead
dc.titleWetting behavior of solders

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