Third-order nonlinear optical properties of Mn doped ZnO thin films under cw laser illumination

dc.contributor.authorNagaraja, K.K.
dc.contributor.authorPramodini, S.
dc.contributor.authorSanthosh Kumar, A.
dc.contributor.authorNagaraja, H.S.
dc.contributor.authorPoornesh, P.
dc.contributor.authorKekuda, D.
dc.date.accessioned2026-02-05T09:34:59Z
dc.date.issued2013
dc.description.abstractWe report the measurements of third-order nonlinear optical properties of undoped zinc oxide and manganese doped zinc oxide thin films with different doping concentrations investigated using z-scan technique. Thin films were prepared by radio frequency magnetron sputtering using a compound target on glass substrate at room temperature. The structural properties of the deposited films were analysed by X-ray diffraction studies. The atomic force microscope analysis of the deposited films reveals that the grain size and roughness of the films depend on the Mn concentration. The direct energy band gap of the deposited film increases with the increase in Mn concentration in the films. The nonlinear optical measurements were carried out using a cw He-Ne laser at 633 nm wavelength. The z-scan results reveal that the films exhibit self-defocusing nonlinearity. The third-order nonlinear optical susceptibility ?(3) is found to be of the order of 10-3 esu. The films investigated here exhibit good optical power limiting at the experimental wavelength. © 2012 Elsevier B.V. All rights reserved.
dc.identifier.citationOptical Materials, 2013, 35, 3, pp. 431-439
dc.identifier.issn9253467
dc.identifier.urihttps://doi.org/10.1016/j.optmat.2012.09.028
dc.identifier.urihttps://idr.nitk.ac.in/handle/123456789/26883
dc.publisherElsevier B.V.
dc.subjectAtomic force microscopy
dc.subjectContinuous wave lasers
dc.subjectEnergy gap
dc.subjectII-VI semiconductors
dc.subjectMagnetron sputtering
dc.subjectMetallic films
dc.subjectNonlinear optics
dc.subjectOptical data processing
dc.subjectOptical properties
dc.subjectOxide films
dc.subjectSemiconductor doping
dc.subjectSubstrates
dc.subjectThin films
dc.subjectX ray diffraction
dc.subjectZinc oxide
dc.subjectManganese-doped zinc oxides
dc.subjectOptical limiting
dc.subjectRadio frequency magnetron sputtering
dc.subjectRf-sputtering
dc.subjectThird order nonlinear optical properties
dc.subjectThird order nonlinear optical susceptibility
dc.subjectz-scan
dc.subjectZnO thin film
dc.subjectOptical films
dc.titleThird-order nonlinear optical properties of Mn doped ZnO thin films under cw laser illumination

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