The effect of substrate temperature on the structural, optical and electrical properties of vacuum deposited ZnTe thin films

dc.contributor.authorRao, G.K.
dc.contributor.authorBangera, K.V.
dc.contributor.authorShivakumar, G.K.
dc.date.accessioned2020-03-31T08:45:42Z
dc.date.available2020-03-31T08:45:42Z
dc.date.issued2009
dc.description.abstractThe present paper reports the effect of substrate temperature on the structural, optical and electrical properties of vacuum deposited zinc telluride (ZnTe) thin films. X-ray diffraction (XRD) analysis of the films, deposited on glass substrates, revealed that they have cubic structure with strong (111) texture. Room temperature deposits are tellurium rich and an increase in the substrate temperature up to 553 K results in stoichiometric films. Electrical conductivity has been observed to increase with the increase in substrate temperature, accompanied by increase in the carrier concentration and the mobility of the carriers. The optical bandgap energy and the thermal activation energy of the films have also been evaluated. 2009 Elsevier Ltd. All rights reserved.en_US
dc.identifier.citationVacuum, 2009, Vol.83, 12, pp.1485-1488en_US
dc.identifier.urihttps://idr.nitk.ac.in/handle/123456789/13370
dc.titleThe effect of substrate temperature on the structural, optical and electrical properties of vacuum deposited ZnTe thin filmsen_US
dc.typeArticleen_US

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