A comprehensive study on the structural, morphological, compositional and optical properties of ZnxCd1-xS thin films

dc.contributor.authorBarman, B.
dc.contributor.authorBangera, K.V.
dc.contributor.authorShivakumar, G.K.
dc.date.accessioned2026-02-05T09:30:28Z
dc.date.issued2019
dc.description.abstractThe absorption loss in cadmium sulfide (CdS) thin films which are widely used as a window layer in a photovoltaic cell limits the efficiency of the device. This issue can be addressed by Zn<inf>x</inf>Cd<inf>1-x</inf>S thin films due to its tunable band gap nature. Herein, the various composition of Zn<inf>x</inf>Cd<inf>1-x</inf>S (x=0, 0.15, 0.30, 0.45, 0.70, 0.85, 1) thin films were grown by a vacuum thermal evaporation technique and the characteristics of the films were investigated by varying the composition 'x'. The x-ray diffraction (XRD) studies displayed that the as-deposited films consist of diffraction peaks from both CdS and ZnS lattice. The formation of ternary Zn<inf>x</inf>Cd<inf>1-x</inf>S films was verified when the deposited films were subjected to an annealing treatment. The morphology of the films was analyzed using a scanning electron microscope (SEM) and it was observed that the films are uniform, homogeneous and free from any pin-holes and cracks. The presence of Zn, Cd and S elements were quantized using an energy dispersive spectroscopy. Optical studies showed a successful non-linear band gap engineering (2.42-3.49 eV) for the deposited Zn<inf>x</inf>Cd<inf>1-x</inf>S thin films. All films showed a very high optical transmittance of above 70% in the visible wavelength region. © 2020 IOP Publishing Ltd.
dc.identifier.citationMaterials Research Express, 2019, 6, 12, pp. -
dc.identifier.urihttps://doi.org/10.1088/2053-1591/ab5df0
dc.identifier.urihttps://idr.nitk.ac.in/handle/123456789/24743
dc.publisherInstitute of Physics Publishing helen.craven@iop.org
dc.subjectCadmium sulfide
dc.subjectEnergy dispersive spectroscopy
dc.subjectEnergy gap
dc.subjectII-VI semiconductors
dc.subjectMorphology
dc.subjectOptical properties
dc.subjectPhotoelectrochemical cells
dc.subjectPhotovoltaic cells
dc.subjectScanning electron microscopy
dc.subjectSemiconductor alloys
dc.subjectSulfur compounds
dc.subjectThermal Engineering
dc.subjectThermal evaporation
dc.subjectVacuum evaporation
dc.subjectZinc sulfide
dc.subjectAnnealing treatments
dc.subjectAs-deposited films
dc.subjectBand gap engineering
dc.subjectDiffraction peaks
dc.subjectHigh transmittance
dc.subjectVacuum thermal evaporation
dc.subjectVisible wavelengths
dc.subjectWindow layer
dc.subjectThin films
dc.titleA comprehensive study on the structural, morphological, compositional and optical properties of ZnxCd1-xS thin films

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