Influence of substrate temperature and post deposition annealing on the properties of vacuum deposited ZnSe thin films

dc.contributor.authorGowrish, Rao, K.
dc.contributor.authorBangera, K.V.
dc.contributor.authorShivakumar, G.K.
dc.date.accessioned2020-03-31T08:35:27Z
dc.date.available2020-03-31T08:35:27Z
dc.date.issued2013
dc.description.abstractThe effects of substrate temperature and post deposition annealing on the structural, optical and electrical properties of vacuum deposited ZnSe thin films are presented here. The chemical composition of the films varied drastically with substrate temperature which in turn caused changes in various properties of the films. The grain size of the films increased with substrate temperature and also after annealing. The electrical properties of the films were found to be varying as a function of chemical composition and grain size. 2012 Elsevier Ltd.en_US
dc.identifier.citationMaterials Science in Semiconductor Processing, 2013, Vol.16, 2, pp.269-273en_US
dc.identifier.urihttps://idr.nitk.ac.in/handle/123456789/11692
dc.titleInfluence of substrate temperature and post deposition annealing on the properties of vacuum deposited ZnSe thin filmsen_US
dc.typeArticleen_US

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