Locating open-channels in octagon networks on chip-microprocessors
| dc.contributor.author | Bhowmik, B. | |
| dc.contributor.author | Biswas, S. | |
| dc.contributor.author | Deka, J.K. | |
| dc.contributor.author | Bhattacharya, B.B. | |
| dc.date.accessioned | 2026-02-06T06:36:47Z | |
| dc.date.issued | 2020 | |
| dc.description.abstract | Networks-on-chip (NoCs) provide the essential communication infrastructure for building today's on-chip multiprocessors. Albeit mesh is commonly used as the underlying interconnection architecture, other regular topologies such as octagons or spidergons, find recent applications to hybrid, small-world, and smart networks. Aggressive technology scaling, however, makes NoCs susceptible to manufacturing defects and causes failures in their operations. This paper presents a distributed, on-line built-in-self-test (BIST) mechanism that targets open faults on communication channels in an octagon NoC. We introduce a novel test scheduling scheme that exploits the knowledge of multithreading for reducing the overall test time with minimal degradation of performance. We evaluate the proposed test scheme for a 16-bit octagon NoC and report experimental results. © 2020 IEEE. | |
| dc.identifier.citation | Proceedings of IEEE Computer Society Annual Symposium on VLSI, ISVLSI, 2020, Vol.2020-July, , p. 200-205 | |
| dc.identifier.issn | 21593469 | |
| dc.identifier.uri | https://doi.org/10.1109/ISVLSI49217.2020.00044 | |
| dc.identifier.uri | https://idr.nitk.ac.in/handle/123456789/30680 | |
| dc.publisher | IEEE Computer Society help@computer.org | |
| dc.subject | Distributed fault detection | |
| dc.subject | Networks-on-chip | |
| dc.subject | Open-channel faults | |
| dc.subject | Reliability and performance | |
| dc.title | Locating open-channels in octagon networks on chip-microprocessors |
