Advancement and challenges in MOSFET scaling

dc.contributor.authorRatnesh, R.K.
dc.contributor.authorGoel, A.
dc.contributor.authorKaushik, G.
dc.contributor.authorGarg, H.
dc.contributor.authorChandan, n.
dc.contributor.authorSingh, M.
dc.contributor.authorPrasad, B.
dc.date.accessioned2026-02-05T13:17:28Z
dc.date.issued2021
dc.description.abstractIn this study, we enlighten about the field effect transistors (FET) and their technologies. As far as very large integration is concerned, researchers are continuously focusing on scaling the transistors in a way to improve the transistors efficiency. In today's era, electronics and semiconductor industries are developing in such a manner that different nano scaled transistors work with low power as well as low cost designs. However, scaling of metal oxide semiconductor field effect transistor (MOSFET) into nanometer scale induces some effects like short channel effects, tunneling effects, and threshold voltage effects etc., which degrade the performance as well as cause challenges to the fabrication process. This review article deals not only with the limitations of scaling and ways to resolve them but also contains detailed study of silicon nanowire and other distinctive nano FET. Moreover, these research finding are helpful in directing the current advancements in MOSFET technology and gave a brief sketch of possible future technologies. © 2021
dc.identifier.citationMaterials Science in Semiconductor Processing, 2021, Vol.134, , p. -
dc.identifier.issn13698001
dc.identifier.urihttps://doi.org/10.1016/j.mssp.2021.106002
dc.identifier.urihttps://idr.nitk.ac.in/handle/123456789/28362
dc.publisherElsevier Ltd
dc.subjectMOSFET Scaling
dc.subjectMulti gate devices
dc.subjectNano FET and CNTFET
dc.subjectScaling issue
dc.titleAdvancement and challenges in MOSFET scaling

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