Study of the aluminium oxide doped zinc oxide thin films prepared by thermal evaporation technique

dc.contributor.authorPalimar, S.
dc.contributor.authorBanger, K.V.
dc.contributor.authorShivakumar, G.K.
dc.date.accessioned2026-02-05T09:35:09Z
dc.date.issued2012
dc.description.abstractThe present study reports the observations made on investigations carried out to study structural, optical and electrical properties of aluminium oxide doped ZnO thin films obtained by thermal evaporation technique. Films obtained are found to be amorphous in nature with smooth and continuous surface. Room temperature conductivity of the film is found to be 5x10 3 U -1 cm -1 with visible region transmittance of above 95%. The optical energy gap of the film is found to be 3.25 eV. From the calculations of activation energy, it is observed that the doped ZnO film has two donor levels, one at 142 meV and other at 43 meV. A detailed analysis of the result is reported. © 2012 Asian Network for Scientific Information.
dc.identifier.citationJournal of Applied Sciences, 2012, 12, 16, pp. 1775-1777
dc.identifier.issn18125654
dc.identifier.urihttps://doi.org/10.3923/jas.2012.1775.1777
dc.identifier.urihttps://idr.nitk.ac.in/handle/123456789/26956
dc.subjectAluminium oxide
dc.subjectContinuous surface
dc.subjectDonor levels
dc.subjectDoped zinc oxide thin films
dc.subjectDoped ZnO
dc.subjectDoped ZnO thin films
dc.subjectElectrical conductivity
dc.subjectOptical and electrical properties
dc.subjectOptical energy gap
dc.subjectOptical propem
dc.subjectRoom-temperature conductivity
dc.subjectThermal evaporation technique
dc.subjectVisible region
dc.subjectZnO thin film
dc.subjectActivation energy
dc.subjectAmorphous films
dc.subjectElectric conductivity
dc.subjectMetallic films
dc.subjectOptical films
dc.subjectOxides
dc.subjectZinc oxide
dc.subjectThermal evaporation
dc.titleStudy of the aluminium oxide doped zinc oxide thin films prepared by thermal evaporation technique

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