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Author: search.filters.author.Talawar, B.Subject: search.filters.subject.Migration

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    Nonvolatile Memory Technologies: Characteristics, Deployment, and Research Challenges
    (Springer International Publishing, 2023) Rai, S.; Talawar, B.
    Nonvolatile memory (NVM) is a class of memory that exhibits persistence, similar to secondary memory, while providing access speeds at least an order of two magnitudes faster. In this area, phase change memory (PCM), spin-transfer torque random access memory (STT-RAM), and resistive RAM (ReRAM) have emerged as the major contenders for commercial and industrial use. With the enormous amount of data being generated, most recent applications demand huge memory footprints, large bandwidth, low energy consumption, and low price. Conventional DRAM-based memories face several issues, such as scalability and high static power consumption. Hence there is a necessity to build alternative memory devices to satisfy the demands of new applications. In this regard, NVMs are gaining prominence these days. This chapter gives a complete overview of the NVM devices, including characteristics, deployment, and challenges in integrating them at different levels of the memory hierarchy. © The Author(s), under exclusive license to Springer Nature Switzerland AG 2023.
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    Challenges in Design, Data Placement, Migration and Power-Performance Trade-offs in DRAM-NVM-based Hybrid Memory Systems
    (Taylor and Francis Ltd., 2023) Rai, S.; Talawar, B.
    DRAM-NVM-based hybrid memory opens up a varied range of power-performance-area operational configurations through page migration between the high-performance DRAM and the reliable NVM. The amalgamation of two technologies requires various modifications for the existing monolithic DRAM-based systems. This paper summarizes the current research work in the areas of data placement and page migration in hybrid memories. The challenges and design solutions from a range of NVMs-PCM, STT-RAM, ReRAM is presented. This paper also identifies several research challenges in these areas. © 2023 IETE.