Faculty Publications

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Author: search.filters.author.Raveendra Kiran, M.R.Subject: search.filters.subject.Electric impedance

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    Investigation of hole-injection in ?-NPD using capacitance and impedance spectroscopy techniques with F4TCNQ as hole-injection layer: Initial studies
    (Academic Press, 2014) Fernandes, J.M.; Raveendra Kiran, M.R.; Ulla, H.; Satyanarayan, M.N.; Umesh, G.
    The charge accumulation leading to injection at the organic interface in the sequentially doped hole-only device structure is studied using capacitance and impedance based spectroscopic techniques. In this paper, we investigate the role of p-type dopant 2,3,5,6-tetrafluoro-7,7,8,8-tetracyanoquinodimethane (F4TCNQ) in the charge transport properties of N,N'-Di(1-naphthyl)-N,N'-diphenyl-(1,1?-biphenyl)-4,4?-diamine (?-NPD) through sequential deposition. We show that the hole injection into ?-NPD increases with the increase of interlayer (F4TCNQ) thickness by correlating the current density-voltage, capacitance-voltage, capacitance-frequency and impedance measurements. © 2014 Elsevier Ltd. All rights reserved.
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    Investigation of hole transport in ?-NPD using impedance spectroscopy with F4TCNQ as hole-injection layer
    (Academic Press, 2015) Fernandes, J.M.; Raveendra Kiran, M.R.; Ulla, H.; Satyanarayan, M.N.; Umesh, G.
    The charge carrier transport is studied in N,N?-di(1-naphthyl)-N,N?-diphenyl-(1,1?-biphenyl)-4,4?-diamine (?-NPD) with the incorporation of sequentially doped p-type dopant 2,3,5,6-tetrafluoro-7,7,8,8-tetracyanoquinodimethane (F4TCNQ) as hole-injection layer in hole-only device structures. The field dependent mobility of the charge carriers is determined using frequency dependent capacitance, conductance and impedance methods by varying the thickness of ?-NPD. The Poole-Frenkel zero-field mobility and the Poole-Frenkel coefficient thus obtained for each device in all the three methods is found to be almost constant. © 2015 Elsevier Ltd. All rights reserved.
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    Investigation of charge transport in Vanadyl-phthalocyanine with molybdenum trioxide as a buffer layer: Impedance spectroscopic analysis
    (Elsevier Ltd, 2015) Raveendra Kiran, M.R.; Ulla, H.; Krishnamanohara; Satyanarayan, M.N.; Umesh, G.
    Charge transport in organic materials is one of the intrinsic properties, which governs the device performance. In this paper, we report the fabrication and electrical characterization of two diodes ITO/VOPc/MoO3/Al and ITO/VOPc/Al. We investigate the electrical conduction of Vanadyl phthalocyanine (VOPc) in both the devices and also the effect of MoO3 as a buffer layer. Improvement of current density through the device is estimated using current density - voltage characteristics and capacitance - voltage characteristics. Space charge limited current (SCLC) conduction with an exponential trap distribution is observed from Impedance measurements. The dominant hopping charge transport is discussed based on ac conductivity measurements and by adopting Correlated barrier hopping (CBH) model. © 2015 Elsevier B.V. All rights reserved.
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    Effect of deposition rate on the charge transport in Vanadyl-phthalocyanine thin films
    (Elsevier Ltd, 2017) Raveendra Kiran, M.R.; Ulla, H.; Satyanarayan, M.N.; Umesh, G.
    We report fabrication of Vanadyl phthalocyanine (VOPc) based diodes with different deposition rates (0.1, 1 and 5 Å/s) in hole only device configuration: ITO/MoO3/VOPc/MoO3/Al. The dc and ac electrical conductivity of Vanadyl phthalocyanine based devices is investigated by employing Impedance spectroscopy measurements. The frequency dependence of conductivity indicates that the dominant mechanism for charge transport is the hopping type. Further, the dependence of conductivity on temperature and bias voltage clearly indicates that the hopping mechanism is described by the correlated barrier hopping (CBH) model. The thin layer (3 nm) of MoO3 in our devices is seen to enhance the electrical conductivity. J-V measurements indicate that the current density J as well as the charge carrier mobility are higher for the devices fabricated at a relatively lower deposition rate (0.1 Å/s). Our results suggest that the VOPC films deposited at lower rates are more appropriate for the optoelectronic device applications. © 2016 Elsevier B.V.