Faculty Publications

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Memory type switching behavior of ternary Ge20Te80-xSnx (0 x 4) chalcogenide compounds
(Institute of Physics Publishing michael.roberts@iop.org, 2016) Fernandes, B.J.; Sridharan, K.; Pumlianmunga, P.; Ramesh, K.; Udayashankar, N.K.
Chalcogenide compounds have gained huge research interest recently owing to their capability to transform from an amorphous to a crystalline phase with varying electrical properties. Such materials can be applied in building a new class of memories, such as phase-change memory and programmable metallization cells. Here we report the memory type electrical switching behavior of a ternary chalcogenide compound synthesized by doping Tin (Sn) in a germanium-telluride (Ge20Te80) host matrix, which yielded a composition of Ge20Te80-xSnx (0 x 4). Results indicate a remarkable decrease in the threshold switching voltage (V T) from 140 to 61 V when the Sn concentration was increased stepwise, which is attributed to the domination of the metallicity factor leading to reduced amorphous network connectivity and rigidity. Variation in the threshold switching voltage (V T) was noticed even when the sample thickness and temperature were altered, confirming that the memory switching process is of thermal origin. Investigations using x-ray diffraction (XRD) and scanning electron microscopy (SEM) revealed the formation of a crystalline channel that acts as the conduction path between the two electrodes in the switched region. Structural and morphological studies indicated that Sn metal remained as a micro inclusion in the matrix and hardly contributed to the rigid amorphous network formation in Ge20Te80-xSnx. Memory type electrical switching observed in these ternary chalcogenide compounds synthesized herein can be explored further for the fabrication of phase-change memory devices. © 2016 IOP Publishing Ltd.
Crystallization kinetics of Sn doped Ge20Te80?xSnx (0 ? x ? 4) chalcogenide glassy alloys
(Elsevier Ltd, 2017) Fernandes, B.J.; Naresh, N.; Ramesh, K.; Sridharan, K.; Udayashankar, N.K.
Chalcogenide semiconductors have evolved as multifunctional materials due to their fascinating thermal, optical, electrical and mechanical properties. In this report, Ge20Te80?xSnx (0 ? x ? 4) glassy alloys are systematically studied in order to understand the effect of variation of Sn content on the thermal parameters such as glass transition (Tg) onset crystallization (Tc), peak crystallization (Tp), melting temperature (Tm), activation energy of glass transition (Eg), and crystallization (Ec). The values of Eg are calculated from the variation of Tg with the heating rate (?), according to Kissinger and Moynihan model, while the values of Ec are calculated from the variation of Tp with the heating rate (?), according to Kissinger, Takhor, Augis-Bennett and Ozawa model. Thermal stability and glass forming ability (GFA) are discussed for understanding the applicability of the synthesized materials in phase change memory (PCM) applications. Thermal parameters are correlated with the electrical switching studies to get an insight into the phase change mechanism. The results of the calculated thermal parameters reveal that the GFA of the synthesized Ge20Te80?xSnx (0 ? x ? 4) glassy alloys has a synchronous relationship with their thermal properties studied through differential scanning calorimetry, indicating their potential for phase-change memory device applications. © 2017 Elsevier B.V.
Electrical switching in Si20Te80 ? xBix (0 ? x ? 3) chalcogenide glassy alloys
(Elsevier B.V., 2018) Fernandes, B.J.; Ramesh, K.; Udayashankar, N.K.
Chalcogenide glasses have attained enormous research interest due to their importance in finding electronic memories. Here we report electrical switching and thermal crystallization behavior of Si20Te80 ? xBix (0 ? x ? 3) glasses. We observe a significant decrease in the threshold voltage (VT) and the thermal stability (?T), indicating that in Si20Te80 ? xBix glasses, the resistivity of the additive element Bi plays a dominant role over network connectivity/rigidity. The variation of VT with respect to thickness and temperature of the sample indicates that the memory switching observed in Si20Te80 ? xBix glasses is influenced by the thermally induced transitions (thermal mechanism). Scanning electron microscopy (SEM) studies on pre-switched and post switched samples reveal the morphological changes on the surface of the sample, and serve as an experimental evidence for the formation of the crystalline filament between two electrodes during switching. Furthermore, the decrease in ?T values indicates that the Si-Te glasses become de-vitrifiable more easily with the addition of Bi, influencing the decrease of VT. Structural evaluation like thermal devitrification studies and morphological changes elucidate the restricted glass formability of the studied glass system. © 2018 Elsevier B.V.
Crystallization kinetics of Si20Te80?xBix (0???x???3) chalcogenide glasses
(Elsevier Ltd, 2019) Fernandes, B.J.; Ramesh, K.; Udayashankar, N.K.
In this report, we investigate the crystallization kinetics of Si20Te80?xBix (0 ? x ? 3) chalcogenide glassy systems using differential scanning calorimetry (DSC) technique. Systematic studies are carried out in order to understand the variation of thermal parameters such as glass transition temperature (Tg), onset crystallization temperature (Tc) and peak crystallization temperature (Tp) as a function of composition. Activation energy for glass transition (Eg) and crystallization (Ec) has been calculated based on the relevant statistical methods. Furthermore, thermal parameters such as change in specific heat (?Cp), fragility index (F), thermal stability (?T)& (S), enthalpy (?Hc), entropy (?S) are deduced to interpret distinct material behaviour as a function of composition. Structural evaluation like thermal devitrification studies elucidate the restricted glass formability of the studied glass system. Conclusively, a relationship has been established between the obtained thermal parameters and electrical switching characteristics. © 2019 Elsevier B.V.

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