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Author: search.filters.author.Deka, J.K.Subject: search.filters.subject.Fault test

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    Reliability Monitoring in a Smart NoC Component
    (Institute of Electrical and Electronics Engineers Inc., 2020) Bhowmik, B.; Deka, J.K.; Biswas, S.
    SMART NoC topology components, such as octagon, spidergon are progressively becoming the primary design choice for implementing the communication backbone in a multi-core SoC platform for lowering a high number of inter-router hops required by long-range traffic. However, aggressive technology scaling has increased the number of transient/permanent faults raising the reliability concerns in a SMART NoC. This paper presents a reliability monitoring scheme for addressing channel-short faults in the basic octagon NoC. Along with the online detection and diagnosis of short faults, an effective scheduling scheme is proposed to provide a low-cost test solution that outperforms over a set of prior schemes. © 2020 IEEE.