Faculty Publications
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Publications by NITK Faculty
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Item Reducing False Prediction on COVID-19 Detection Using Deep Learning(Institute of Electrical and Electronics Engineers Inc., 2021) Bhowmik, B.; Varna, S.A.; Kumar, A.; Kumar, R.This paper proposes a custom deep neural network-based scheme for coronavirus disease 2019 (COVID-19) detection. The proposed method takes X-ray images that use transfer learning techniques on pre-trained models. One objective of this work is to quickening the detection of the virus. Another goal is to reduce the number of falsely detected cases by a significant margin. The experimental setup demonstrates promising results on the selected dataset, which achieve up to 99.74%, 99.69%, 98.80% as classification, precision, and recall accuracy. © 2021 IEEE.Item Stress Detection Using Deep Learning Algorithms(Institute of Electrical and Electronics Engineers Inc., 2023) Angalakuditi, H.; Bhowmik, B.Stress has become a prevalent issue in modern society, with various negative impacts on mental and physical health. Stress in people is a physiological and psychological reaction to an imagined threat or difficulty. Several things, including employment, relationships, income, health problems, and significant life transitions, can cause stress. Depending on the person and the circumstance, stress symptoms can vary. They frequently include emotions of worry, irritation, and restlessness, as well as physical symptoms like headaches and muscle strain. Early stress detection is crucial for effective intervention and prevention of stress-related health issues. Detecting stress in real-time can be valuable in various domains such as healthcare, mental health, human-computer interaction, and workplace performance. This paper proposes a method for detecting stress using deep learning. A set of pre-trained models are employed for stress detection. The proposed technique is evaluated with publicly available datasets. Experimented results showed that the proposed stress detection method achieves accuracy in the range of 85.71-97.50% and the loss ranging from 0.4061 to 1.8144. © 2023 IEEE.