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Author: search.filters.author.Bharath, S.P.Subject: search.filters.subject.Cadmium

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    Properties of CdxZn1-xO thin films and their enhanced gas sensing performance
    (Elsevier Ltd, 2017) Bharath, S.P.; Bangera, K.V.; Shivakumar, G.K.
    CdxZn1-xO(0 ? x ? 0.20) thin films with different Cd concentrations were successfully deposited on glass substrate using spray pyrolysis technique. X-ray diffraction (XRD), scanning electron microscope (SEM) and energy dispersive X-ray analysis (EDAX) were used for structural, surface morphological and compositional characterization. The XRD analysis revealed that the synthesized films were hexagonal in structure with (002) orientation. The SEM studies confirm the formation of homogeneous and uniform films. Optical transmittance and electrical conductivity of the films were evaluated using UV–Visible spectroscopy and two probe method respectively. The optical studies showed that the CdxZn1-xO thin films have optical transmittance in entire visible region. The resistivity of undoped films were very high and it decreases with addition of cadmium. The gas sensing properties were investigated at optimal temperature of 350 °C for various volatile organic compounds like acetone, ethanol and methanol. The CdxZn1-xO thin films with 10 at. % cadmium concentration showed the sensitivity of 50% for 1 ppm ethanol. © 2017 Elsevier B.V.
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    Effect of cadmium incorporation on the properties of zinc oxide thin films
    (Springer Nature, 2018) Bharath, S.P.; Bangera, K.V.; Shivakumar, G.K.
    CdxZn1-xO (0 ? x ? 0.20) thin films are deposited on soda lime glass substrates using spray pyrolysis technique. To check the thermal stability, CdxZn1-xO thin films are subjected to annealing. Both the as-deposited and annealed CdxZn1-xO thin films are characterized using X-ray diffraction (XRD), scanning electron microscope (SEM) and energy-dispersive X-ray analysis (EDAX) to check the structural, surface morphological and compositional properties, respectively. XRD analysis reveals that the both as-deposited and annealed CdxZn1-xO thin films are (002) oriented with wurtzite structure. SEM studies confirm that as-deposited, as well as annealed CdxZn1-xO thin films are free from pinholes and cracks. Compositional analysis shows the deficiency in Cd content after annealing. Optical properties evaluated from UV-Vis spectroscopy shows red shift in the band gap for CdxZn1-xO thin films. Electrical property measured using two probe method shows a decrease in the resistance after Cd incorporation. The results indicate that cadmium can be successfully incorporated in zinc oxide thin films to achieve structural changes in the properties of films. © Springer-Verlag GmbH Germany, part of Springer Nature 2018.