Faculty Publications
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Item Synthesis and band gap tuning in CdSe(1-x)Te(x) thin films for solar cell applications(Elsevier Ltd, 2017) Santhosh, T.C.M.; Bangera, K.V.; Shivakumar, G.K.Thin films of CdSe(1-x)Te(x) (x = 0 – 1) were grown on to the glass substrates by thermal evaporation method (PVD). The effect of annealing duration on the formation of single phase ternary alloys were systematically investigated. The prepared thin films were characterized by using FE-SEM, EDS and X-ray diffractometer. The X-ray diffraction studies shows that vacuum annealed films are polycrystalline in nature, and well oriented along a preferred direction of (0 0 2) for hexagonal and along (1 1 1) for cubic crystal structure. It is observed that increase in the CdTe concentration leads to change in the crystal structure from hexagonal to cubic. The absorption coefficients and optical band gaps were evaluated from spectrometric measurements. It is observed that optical band gap can be tuned from 1.67 eV to 1.51 eV as value of x varied from 0 to 1. © 2017 Elsevier LtdItem ZnSxSe1−x thin films: A study into its tunable energy band gap property using an experimental and theoretical approach(Elsevier Ltd, 2022) Ray, S.; Barman, B.; Darshan, C.; Tarafder, K.; Bangera, K.V.In recent times, ZnS and ZnSe thin films are drawing tremendous attention towards opto-electrical devices due to their optimal wide band gap energy. By alloying ZnS and ZnSe films to obtain ZnSxSe1−x thin films, the band gap of the ZnSxSe1−x film can be tuned to a value according to the device requirements. Herein, ZnSxSe1−x thin films were deposited on pre-cleaned glass substrates using a thermal evaporation system and the various properties of the obtained thin films were analyzed by altering the percentage of sulfur concentration in the films. The XRD analysis illustrated that the prepared films are polycrystalline in nature and oriented along cubic (1 1 1) plane. The deviation of (1 1 1) preferential peak position with composition ‘x’ along the absence of any secondary peaks confirms the formation of ternary ZnSxSe1−x thin films. DFT analysis verifies the formation of pristine ZnSxSe1−x alloy system. FESEM micrographs displayed that the ZnSxSe1−x thin films do not have any cracks or pinholes. EDAX analysis of the films revealed the existence of Zn, Se and S in an appropriate quantity. Optical analysis revealed the effective band gap tailoring of ZnSxSe1−x thin films. The band gap of the ZnSxSe1−x thin films increases from 2.59 eV to 3.38 eV as the composition ‘x’ varied from 0 to 1 and band composition was determined using the DOS plot obtained using VASP. © 2022 International Solar Energy Society